Spectroscopy of single metallic nanoparticles using total internal reflection microscopy

Sönnichsen, C.; Geier, S.; Hecker, N. E.; von Plessen, G.; Feldmann, J.; Ditlbacher, H.; Lamprecht, B.; Krenn, J. R.; Aussenegg, F. R.; Chan, V. Z.-H; Spatz, J. P.; Möller, M.

Melville, NY : American Inst. of Physics (2000)
Journal Article

In: Applied physics letters
Volume: 77
Issue: 19
Page(s)/Article-Nr.: 2949-2951