Phase formation and stability in TiOx and ZrOx thin films: Extremely sub-stoichiometric functional oxides for electrical and TCO applications
Henning, Ralph A.; Leichtweiss, Thomas; Dorow-Gerspach, Daniel; Schmidt, Rüdiger; Wolff, Niklas; Schürmann, Ulrich; Decker, Yannic; Kienle, Lorenz; Wuttig, Matthias (Corresponding author); Janek, Jürgen (Corresponding author)
Berlin : De Gruyter (2017)
Journal Article
In: Zeitschrift für Kristallographie / Crystalline materials
Volume: 232
Issue: 1/3
Page(s)/Article-Nr.: 161-183
Institutions
- Department of Physics [130000]
- Chair of Experimental Physics I A and I. Institute of Physics [131110]
Identifier
- DOI: 10.1515/zkri-2016-1981
- RWTH PUBLICATIONS: RWTH-2017-03859