Multi-technique characterization of tantalum oxynitride films prepared by reactive direct current magnetron sputtering
Venkataraj, Selveraj; Kittur, Harish; Drese, Robert Jens; Wuttig, Matthias
Amsterdam [u.a.] : Elsevier (2006)
Journal Article
In: Thin solid films
Volume: 514
Issue: 1/2
Page(s)/Article-Nr.: 1-9
Institutions
- Chair of Experimental Physics I A and I. Institute of Physics [131110]
- Department of Physics [130000]
Identifier
- DOI: 10.1016/j.tsf.2005.08.320
- RWTH PUBLICATIONS: RWTH-CONV-031270