Structure property relations of BST thin films

Fitsilis, Fotios; Regnery, Stefan; Ehrhart, Peter; Waser, Rainer; Schienle, Frank; Schumacher, Marcus; Jürgensen, Holger

Philadelphia, Pa : Gordon and Breach Science Publ. (2001)
Journal Article

In: Integrated ferroelectrics
Volume: 38
Issue: 1/4
Page(s)/Article-Nr.: 855-864