Grazing incidence diffuse X-ray scattering investigation of the properties of irradiation-induced point defects in silicon

Partyka, P. J.; Zhong, Y.; Nordlund, K.; Averback, R. S.; Robinson, I. M.; Ehrhart, Peter

Ridge, NY : APS (2001)
Journal Article

In: Physical review / B
Volume: 64
Issue: 23
Page(s)/Article-Nr.: 235207