Characterization of porous silicon layers by reflectance spectroscopy

Theiss, W.; Grosse, P.; Münder, H.; Lüth, H.; Herino, R.; Ligeon, M.

(1993)
Contribution to a conference proceedings

In: Proc. Mat. Res. Soc. Sympos. 238 (1993)
Page(s)/Article-Nr.: 215