Metallic filamentary conduction in valence change-based resistive switching devices: the case of TaO x thin film with x ∼ 1
Rosário, Carlos M. M. (Corresponding author); Thöner, Bo; Schönhals, Alexander; Menzel, Stephan; Meledin, Alexander; Barradas, Nuno P.; Alves, Eduardo; Mayer, Joachim; Wuttig, Matthias; Waser, Rainer; Sobolev, Nikolai A.; Wouters, Dirk J.
Cambridge : RSC Publ. (2019)
Fachzeitschriftenartikel
In: Nanoscale
Band: 11
Heft: 36
Seite(n)/Artikel-Nr.: 16978-16990
Identifikationsnummern
- DOI: 10.1039/C9NR05285B
- RWTH PUBLICATIONS: RWTH-2020-04653