Quantification of Carrier Density Gradients along Axially Doped Silicon Nanowires Using Infrared Nanoscopy

Jung, Lena; Pries, Julian; Maß, Tobias Wilhelm Wolfgang; Lewin, Martin; Boyuk, Dmitriy S.; Mohabir, Amar T.; Filler, Michael A. (Corresponding author); Wuttig, Matthias; Taubner, Thomas (Corresponding author)

Washington, DC : ACS (2019)
Fachzeitschriftenartikel

In: ACS photonics
Band: 6
Heft: 7
Seite(n)/Artikel-Nr.: 1744-1754