Grazing incidence diffuse X-ray scattering investigation of the properties of irradiation-induced point defects in silicon

Partyka, P. J.; Zhong, Y.; Nordlund, K.; Averback, R. S.; Robinson, I. M.; Ehrhart, Peter

Ridge, NY : APS (2001)
Fachzeitschriftenartikel

In: Physical review / B
Band: 64
Heft: 23
Seite(n)/Artikel-Nr.: 235207