Comparison between gallium-implanted layers of ZnSe and ZnSSe by optical, electrical and electron beam characterization methods

Gleitsmann, G.; Ammann, Norbert; Hermans, J.; Schneider, A.; Geurts, J.; Karduck, P.; Heuken, M.

(1993)
Beitrag zu einem Tagungsband

In: Proc. 2.-6. Int. Conf. 1993