Comparison between gallium-implanted layers of ZnSe and ZnSSe by optical, electrical and electron beam characterization methods
Gleitsmann, G.; Ammann, Norbert; Hermans, J.; Schneider, A.; Geurts, J.; Karduck, P.; Heuken, M.
(1993)
Beitrag zu einem Tagungsband
In: Proc. 2.-6. Int. Conf. 1993
Identifikationsnummern
- RWTH PUBLICATIONS: RWTH-CONV-192788