The influence of microelectronic processing steps on the properties of porous Si-layers
Erschienen in: Optical properties of low dimensional silicon structures. Hrsg. D.C. Bensahel [u.a.]

Münder, H.
Berger, M. G.
Frohnhoff, S.
Thönissen, M.
Lüth, H.
et al.

1993

Trautwein, A.
Kreibig, U.
Oberhausen, E.

1993

Characterization of porous silicon layers by reflectance spectroscopy
Erschienen in: Proc. Mat. Res. Soc. Sympos. 238 (1993)

Theiss, W.
Grosse, P.
Münder, H.
Lüth, H.
Herino, R.
et al.

1993

Porous silicon
Erschienen in: Proceedings / 9th International Conference on Fourier Transform Spectroscopy : 23 - 27 August 1993, Calgary, Alberta, Canada / John E. Bertie ... chairs/ed.

Theiss, W.
Arntzen, M.
Facsko, S.
Feuerbacher, M.
Wernke, M.
et al.

1993

FTIR-microspectroscopy of organic monolayers in transmission
Erschienen in: Proceedings / SPIE, International Society for Optical Engineering : P. - 2089

Mizaikoff, B.
Kellner, R.
Taga, K.
Theiss, W.
Grosse, P.

1993

Elastic light scattering by spherical particles in the near field approximation
Erschienen in: Eur. Optical Soc.: Annu. Meet. Dig. Ser. 3 (1993)

Quinten, M.

1993

Comparison between gallium-implanted layers of ZnSe and ZnSSe by optical, electrical and electron beam characterization methods
Erschienen in: Proc. 2.-6. Int. Conf. 1993

Gleitsmann, G.
Ammann, Norbert
Hermans, J.
Schneider, A.
Geurts, J.
et al.

1993

Optical and X-ray analysis of ZnSSe/ZnSe superlattices on GaAs, grown by metalorganic vapour phase epitaxy
Erschienen in: Proc. 2.-6. Int. Conf. 1993

Hermans, J.
Woitok, J.
Schiffers, W.
Geurts, J.
Schneider, A.
et al.

1993

Chemical composition of porous silicon layers studied by IR spectroscopy
Erschienen in: Applied surface science
[DOI: 10.1016/0169-4332(93)90098-V]

Theiss, W.
Grosse, P.
Münder, H.
Lüth, H.
Herino, R.
et al.

1993

FTIR-microspectroscopic detection of ultra-thin organic films on chalcogenide fibers
Erschienen in: Fresenius journal of analytical chemistry

Kellner, R.
Mizaikoff, B.
Taga, K.
Theiss, W.
Grosse, P.

1993

Far infrared optical properties of metal-insulator composites
Erschienen in: Zeitschrift für Physik / D, Atoms, molecules and clusters

Sturm, J.
Grosse, P.
Morley, S.
Theiss, W.

1993

Infrared reflection studies of ceramics: Characterization of SiC layers on graphite substrates
Erschienen in: Fresenius journal of analytical chemistry

Hopfe, V.
Grählert, W.
Brennfleck, K.
Korte, E. H.
Theiss, W.

1993

Characterisation of porous silicon layers by spectroscopic ellipsometry
Erschienen in: Journal of luminescence

Rossow, U.
Münder, H.
Thönissen, M.
Theiss, W.

1993

A contribution to friction between solids
Erschienen in: Physica status solidi / B, Basic solid state physics
[DOI: 10.1002/pssb.2221760210]

Gerlach, E.

1993

Light induced aggregation of metal cluster
Erschienen in: Zeitschrift für Physik / D, Atoms, molecules and clusters

Eckstein, H.
Kreibig, U.

1993

The optical extinction of ligand stabilized Au13 and Au55-clusters: The vanishing of the Mie-resonance
Erschienen in: Zeitschrift für Physik / D, Atoms, molecules and clusters

Hermann, M.
Kreibig, U.
Schmid, G.

1993

Binary cluster: Homogeneous alloys and nucleus-shell structures
Erschienen in: Zeitschrift für Physik / D, Atoms, molecules and clusters

Sinzig, J.
Radtke, U.
Quinten, M.
Kreibig, U.

1993

Absorption and elastic scattering of light by particle aggregates
Erschienen in: Applied optics

Quinten, M.
Kreibig, U.

1993

Width of cluster plasmon resonances: Bulk dielectric functions and chemical interface damping
Erschienen in: Physical Review B
[DOI: 10.1103/PhysRevB.48.18178]

Hövel, H.
Fritz, S.
Hilger, A.
Kreibig, U.
Vollmer, M.

1993

Recursion formalism for the scattering coefficients of multicoated spheres. Applications to aerosol particles
Erschienen in: Journal of aerosol science

Quinten, M.
Sinzig, J.

1993

Gallium and nitrogen ion implantation in MOVPE-grown ZnSe/GaAs
Erschienen in: Physica / B, Condensed matter

Geurts, J.
Hermans, J.
Gleitsmann, G.
Geyzers, K. P.
Schneider, A.
et al.

1993

Analysis of band bending at III-V semiconductor interfaces by Raman spectroscopy
Erschienen in: Surface science

Geurts, J.

1993

Investigation of MOVPE-grown InGaAs/InP multi quantum wells by Raman spectroscopy and X-ray diffractometry
Erschienen in: Materials science & engineering / B, Solid state materials for advanced technology

Finders, J.
Keuter, M.
Gnoth, D.
Geurts, J.
Woitok, J.
et al.

1993

Control of Schottky barrier height of Ag/Mn/n-GaAs(110) diodes with Mn interlayer thickness
Erschienen in: Semiconductor science and technology
[DOI: 10.1088/0268-1242/7/3/011]

Spaltmann, D.
Geurts, J.
Esser, N.
Zahn, D. R. T.
Richter, W.
et al.

1992

The influence of Cd overpressure in the molecular beam epitaxy of InSb/CdTe heterostructures: A combined Raman and infrared spectroscopy study
Erschienen in: Applied surface science

Zahn, D. R. T.
Richter, W.
Eickhoff, T.
Geurts, J.
Golding, T. D.
et al.

1989

Radiation-induced band bending on GaAs(110)
Erschienen in: Surface science

Geurts, J.
Latta, E. E.
Reihl, B.

1989

Bismuth on GaAs(110): Characterisation of growth mode and Schottky barrier formation at low and room temperature
Erschienen in: Applied surface science

Esser, N.
Hünermann, M.
Resch, U.
Spaltmann, D.
Geurts, J.
et al.

1989

Epitaxial InSb(111) layers on Sb(111) substrates characterized by Raman spectroscopy
Erschienen in: Journal of physics / Condensed matter

Rettweiler, U.
Richter, W.
Resch, U.
Geurts, J.
Sporken, R.
et al.

1989

Plasma excitation in semiconductors containing extended scattering centers
Erschienen in: Physica status solidi / B, Basic solid state physics

Gerlach, E.
Kistinger, S.

1989

Epitaxial InSb(111) layers on Sb(111) substrates characterized by Raman spectroscopy
Erschienen in: Journal of physics / Condensed matter

Rettweiler, U.
Richter, W.
Resch, U.
Geurts, J.
Sporken, R.
et al.

1989

Plasma etched and sputtered GaAs(100) surfaces investigated by ellipsometry and Raman spectroscopy
Erschienen in: Journal of physics / Condensed matter

Rossow, U.
Fieseler, T.
Geurts, J.
Zahn, D. R. T.
Richter, W.
et al.

1989

Strukturuntersuchungen an hochdispersen und kompakten Kieselgläsern mittels IR-Spektroskopie
Erschienen in: Glass science and technology

Clasen, R.
Grosse, P.
Theiss, W.

1989

Raman spectroscopy of InSb/CdTe heterostructures: Improved interface quality obtained by Cd-overpressure during molecular beam epitaxial growth
Erschienen in: Applied physics letters

Zahn, D. R. T.
Golding, T. D.
Mackey, K. J.
Geurts, J.
Dinan, J. H.
et al.

1988