Quantification of Carrier Density Gradients along Axially Doped Silicon Nanowires Using Infrared Nanoscopy

Washington, DC / ACS (2019) [Journal Article]

ACS photonics
Volume: 6
Issue: 7
Page(s): 1744-1754

Authors

Selected Authors

Jung, Lena
Pries, Julian
Maß, Tobias Wilhelm Wolfgang
Lewin, Martin
Boyuk, Dmitriy S.

Other Authors

Mohabir, Amar T.
Filler, Michael A.
Wuttig, Matthias
Taubner, Thomas

Identifier