Quantification of Carrier Density Gradients along Axially Doped Silicon Nanowires Using Infrared Nanoscopy
Washington, DC / ACS (2019) [Journal Article]
ACS photonics
Volume: 6
Issue: 7
Page(s): 1744-1754
Authors
Selected Authors
Jung, Lena
Pries, Julian
Maß, Tobias Wilhelm Wolfgang
Lewin, Martin
Boyuk, Dmitriy S.
Other Authors
Mohabir, Amar T.
Filler, Michael A.
Wuttig, Matthias
Taubner, Thomas
Identifier
- DOI: 10.1021/acsphotonics.9b00466
- REPORT NUMBER: RWTH-2019-07393