Quantification of Carrier Density Gradients along Axially Doped Silicon Nanowires Using Infrared Nanoscopy
Washington, DC / ACS (2019) [Journal Article]
ACS photonics
Volume: 6
Issue: 7
Page(s): 1744 - 1754
Authors
Selected Authors
Jung, Lena
Pries, Julian
Maß, Tobias Wilhelm Wolfgang
Lewin, Martin
Boyuk, Dmitriy S.
Other Authors
Mohabir, Amar T.
Filler, Michael A.
Wuttig, Matthias
Taubner, Thomas Günter
Identifier
- DOI: 10.1021/acsphotonics.9b00466
- REPORT NUMBER: RWTH-2019-07393