Imaging of phase change materials below a capping layer using correlative infrared near-field microscopy and electron microscopy

Melville, NY / American Inst. of Physics (2015) [Journal Article]

Applied physics letters
Volume: 107
Issue: 15
Page(s): 151902


Selected Authors

Lewin, Martin
Hauer, Benedikt
Bornhöfft, Manuel
Jung, Lena
Benke, Julia

Other Authors

Michel, Ann-Katrin U.
Mayer, Joachim
Wuttig, Matthias
Taubner, Thomas