Infrared reflection studies of ceramics: Characterization of SiC layers on graphite substrates

Hopfe, V.; Grählert, W.; Brennfleck, K.; Korte, E. H.; Theiss, W.

Berlin [u.a.] : Springer (1993)
Journal Article

In: Fresenius journal of analytical chemistry
Volume: 346
Page(s)/Article-Nr.: 99-103