Characterization of phase change memory materials using phase change bridge devices

Melville, NY / AIP (2009) [Journal Article]

Journal of applied physics
Volume: 106
Issue: 5
Page(s): 054308


Selected Authors

Krebs, Daniel
Raoux, Simone
Rettner, Charles T.
Burr, Geoffrey W.
Shelby, Robert M.

Other Authors

Salinga, Martin
Jefferson, C. Michael
Wuttig, Matthias