Characterization of porous silicon layers by reflectance spectroscopy

Theiss, W.; Grosse, P.; Münder, H.; Lüth, H.; Herino, R.; Ligeon, M.

(1993) [Contribution to a conference proceedings]

Proc. Mat. Res. Soc. Sympos. 238 (1993)
Page(s): 215

Identifier

  • REPORT NUMBER: RWTH-CONV-192784