Investigation of MOVPE-grown InGaAs/InP multi quantum wells by Raman spectroscopy and X-ray diffractometry

Finders, J.; Keuter, M.; Gnoth, D.; Geurts, J.; Woitok, J.; Kohl, A.; Möller, R.; Heime, K.

Lausanne : Elsevier Sequoia (1993)
Journal Article

In: Materials science & engineering / B, Solid state materials for advanced technology
Volume: 21
Page(s)/Article-Nr.: 161