Advanced characterization tools for thin films in low-E systems

Weis, H.; Müggenburg, T.; Friedrich, I.; Grosse, P.; Herlitze, L.; Wuttig, Matthias

Amsterdam [u.a.] : Elsevier (1999)
Journal Article

In: Thin solid films
Volume: 351
Page(s)/Article-Nr.: 184-184

Identifier