Impact of annealing on electrical properties of Cu2ZnSnSe4 absorber layers

Melville, NY / American Inst. of Physics (2016) [Fachzeitschriftenartikel]

Journal of applied physics
Volume: 120
Issue: 4
Page(s): 045703 -

Authors

Selected Authors

Weiss, Thomas
Redinger, Alex
Rey, Germain
Schwarz, Torsten
Spies, Maria

Other Authors

Cojocura-Mirédin, Oana
Choi, P.-P.
Siebentritt, Susanne

Identifier